Origin of forward bias capacitance peak and intersection behavior of C and G/w of Ag/p-InP Schottky barrier diodes
| dc.contributor.author | Korucu, D. | |
| dc.contributor.author | Turut, A. | |
| dc.contributor.author | Turan, R. | |
| dc.contributor.author | Altindal, S. | |
| dc.date.accessioned | 2025-05-10T19:43:08Z | |
| dc.date.issued | 2013 | |
| dc.department | İstanbul Medeniyet Üniversitesi | |
| dc.description.abstract | Frequency-dependent electrical characteristics of Ag/p-InP diodes have been determined using impedance spectroscopy at room temperature. Series resistance (R,) and interface state(s) (N-ss) values were extracted from capacitance (C) and conductance (G/w) data using the Nicollian and Goetzberger and Hill-Coleman methods, respectively. C and G/w data were also corrected in the whole measured bias voltage range to obtain real diode capacitance C-c and conductance G(c) values in order to see the effects of R-s. Both the C-V and R-s-V plots showed anomalous peak in depletion region especially at low frequencies due to the existence of N-ss. C-V and G/w-V plots crossed at a certain bias voltage and this point shifted toward negative bias voltages with increasing frequency and then disappeared at 3 MHz. Also, decrease in C values corresponds to an increase in G/w values in the same bias voltages. (C) 2012 Elsevier Ltd. All rights reserved. | |
| dc.identifier.doi | 10.1016/j.mssp.2012.09.015 | |
| dc.identifier.endpage | 351 | |
| dc.identifier.issn | 1369-8001 | |
| dc.identifier.issn | 1873-4081 | |
| dc.identifier.issue | 2 | |
| dc.identifier.scopus | 2-s2.0-84875210454 | |
| dc.identifier.scopusquality | Q1 | |
| dc.identifier.startpage | 344 | |
| dc.identifier.uri | https://doi.org/10.1016/j.mssp.2012.09.015 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14730/10492 | |
| dc.identifier.volume | 16 | |
| dc.identifier.wos | WOS:000316581400018 | |
| dc.identifier.wosquality | Q2 | |
| dc.indekslendigikaynak | Web of Science | |
| dc.indekslendigikaynak | Scopus | |
| dc.language.iso | en | |
| dc.publisher | Elsevier Sci Ltd | |
| dc.relation.ispartof | Materials Science in Semiconductor Processing | |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.snmz | KA_WOS_20250302 | |
| dc.subject | Ag/p-InP SBD | |
| dc.subject | Impedance spectroscopy | |
| dc.subject | Series resistance | |
| dc.subject | Interface states | |
| dc.subject | Intersection in C | |
| dc.subject | G | |
| dc.title | Origin of forward bias capacitance peak and intersection behavior of C and G/w of Ag/p-InP Schottky barrier diodes | |
| dc.type | Article |
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